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Computerized Tomography (CT)

  • Computerized industrial tomograph NIKON XT H 225 ST with Detector Perkin Elmer 1620
  • X-ray source microfocus: 225 KV, focal spot size from 3 to 225 µm
  • Internal defect analysis and failure analysis, reverse engineering, 3D CAD comparison, fiber analysis (carbon) and composite materials, dimensional analysis, analysis on electronic boards, volumetric porosity check and in section according to P202 / VW 50093 and P201 / VW 50097 specifications